Course Contents
The course covers the following:
- Basic optics, optical components and systems
- Sources and detectors
- Laser beam propagation
- Interference metrology of surfaces and length
- Holography, holographic interferometry, speckle techniques, diffractive optics
- Moiré techniques and Talbot phenomenon
- Metrology based on polarization techniques
- Metrology of biological systems
- Optical microscopy, confocal microscopy, phase-contrast
- Metrology of optical systems and image analysis
- Fiber optic based metrology
- MEMs and MOEMs based techniques
- Miscellaneous topics like adaptive optics, ellipsometry, plasmonics, magentooptics, vortex beam metrology
Books:
- K. J. Gasvik, Optical Metrology, John Wiley and Sons, Chichester (1987)
- Toru Yoshizawa (Ed.), Handbook of Optical Metrology: Principles and Applications, CRC Press, Boca Raton, FL (2009)
- Rajpal S. Sirohi, Introduction to Optical Metrology, CRC Press, Boca Raton, FL (2015)
Subject to the availability of funds, one of the books may be provided to the participants.
